Semiconductor Lifetest Equipment

{
  "id": "001637-2023",
  "tag": [
    "award",
    "contract"
  ],
  "date": "2023-01-19T10:25:02Z",
  "ocid": "ocds-h6vhtk-0398be",
  "buyer": {
    "id": "GB-FTS-155",
    "name": "National Physical Laboratory"
  },
  "awards": [
    {
      "id": "001637-2023-1",
      "status": "active",
      "suppliers": [
        {
          "id": "GB-FTS-73197",
          "name": "Yelo Ltd."
        }
      ],
      "relatedLots": [
        "1"
      ],
      "hasSubcontracting": true
    }
  ],
  "tender": {
    "id": "ocds-h6vhtk-0398be",
    "lots": [
      {
        "id": "1",
        "hasOptions": false,
        "description": "The requirements for such a system are as follows:\nEssential:\n•\tTO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month\n•\tLife-test duration > 10,000 hours\n•\tBurn in / Life-test temperature from Ambient to 150degC with independent heaters in each module  \n•\tMaximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC)\n•\tBar test – Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across.  All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test.\n•\tOptical detector to monitor light output of each device under test\n•\tWavelength range from 400 nm – 1600 nm\n•\tTemperature sensor at each device for close monitoring\n•\tIndependent current drive for each device\n•\tAdaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future “non-standard” testing requests\n•\tLow noise, highly stable current driver for each device (<0.1mA RMS noise)\n•\tStable temperature during life-test (no variation > 1degC)\n•\tRemote access to monitor and control system software",
        "awardCriteria": {
          "criteria": [
            {
              "name": "Technical",
              "type": "cost",
              "description": "70%"
            },
            {
              "name": "Commercial",
              "type": "cost",
              "description": "30%"
            }
          ]
        }
      }
    ],
    "items": [
      {
        "id": "1",
        "relatedLot": "1",
        "deliveryLocation": {
          "description": "NPL Management Ltd\nHampton Road\nTeddington\nTW11 0LW"
        },
        "deliveryAddresses": [
          {
            "region": "UK"
          }
        ]
      }
    ],
    "title": "Semiconductor Lifetest Equipment",
    "status": "complete",
    "coveredBy": [
      "GPA"
    ],
    "legalBasis": {
      "id": "32014L0024",
      "scheme": "CELEX"
    },
    "description": "NPL and the University of Glasgow will work together to establish a service for Burn-in and Life-testing of semiconductor laser diodes in high-volume for manufacturers and suppliers of laser diodes.\nThe requirements for such a system are as follows:\nEssential:\n•\tTO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month\n•\tLife-test duration > 10,000 hours\n•\tBurn in / Life-test temperature from Ambient to 150degC with independent heaters in each module  \n•\tMaximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC)\n•\tBar test – Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across.  All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test.\n•\tOptical detector to monitor light output of each device under test\n•\tWavelength range from 400 nm – 1600 nm\n•\tTemperature sensor at each device for close monitoring\n•\tIndependent current drive for each device\n•\tAdaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future “non-standard” testing requests\n•\tLow noise, highly stable current driver for each device (<0.1mA RMS noise)\n•\tStable temperature during life-test (no variation > 1degC)\n•\tRemote access to monitor and control system software",
    "classification": {
      "id": "38000000",
      "scheme": "CPV",
      "description": "Laboratory, optical and precision equipments (excl. glasses)"
    },
    "procurementMethod": "limited",
    "mainProcurementCategory": "goods",
    "procurementMethodDetails": "Award procedure without prior publication of a call for competition",
    "procurementMethodRationale": "YELO is the only company to manufacture and to sell an industrial burn-in and lifetest system able to test at hight-volume TO-cans, chip-on-carrier and bar in one modular system, with independent current driver for each device, temperature sensors at each device, and oven temperatures up to 150degC. The exclusive design of the YELO Y1000 system allows testing of a wide range of semiconductor laser devices with designs that are still under development.\nThese requirements are all essential for our use due to specific customer requests. Furthermore, these requirements are aligned to what is existing operations at the Compound Semiconductor Applications Catapult (CSAC) – a partner organisation whom NPL and the University of Glasgow closely interact with on Burn-in and Reliability of laser diodes.",
    "procurementMethodRationaleClassifications": [
      {
        "id": "D_OUTSIDE_SCOPE",
        "scheme": "TED_PT_AWARD_CONTRACT_WITHOUT_CALL",
        "description": "The procurement falls outside the scope of application of the directive"
      }
    ]
  },
  "parties": [
    {
      "id": "GB-FTS-155",
      "name": "National Physical Laboratory",
      "roles": [
        "buyer"
      ],
      "address": {
        "region": "UK",
        "locality": "Teddington",
        "postalCode": "TW11 0LW",
        "countryName": "United Kingdom",
        "streetAddress": "Hampton Road"
      },
      "details": {
        "url": "http://www.npl.co.uk",
        "classifications": [
          {
            "id": "BODY_PUBLIC",
            "scheme": "TED_CA_TYPE",
            "description": "Body governed by public law"
          },
          {
            "scheme": "COFOG",
            "description": "Research"
          }
        ]
      },
      "identifier": {
        "legalName": "National Physical Laboratory"
      },
      "contactPoint": {
        "email": "nina.heath@npl.co.uk"
      }
    },
    {
      "id": "GB-FTS-73197",
      "name": "Yelo Ltd.",
      "roles": [
        "supplier"
      ],
      "address": {
        "region": "UKN",
        "locality": "Carrickfergus",
        "postalCode": "BT38 8YF",
        "countryName": "United Kingdom",
        "streetAddress": "Trooperslane Industrial Estate 20 Meadowbank Road"
      },
      "details": {
        "scale": "sme"
      },
      "identifier": {
        "legalName": "Yelo Ltd."
      }
    },
    {
      "id": "GB-FTS-156",
      "name": "NPL Management Ltd",
      "roles": [
        "reviewBody",
        "mediationBody"
      ],
      "address": {
        "locality": "Teddington",
        "postalCode": "TW11 0LW",
        "countryName": "United Kingdom",
        "streetAddress": "Hampton Road"
      },
      "identifier": {
        "legalName": "NPL Management Ltd"
      }
    }
  ],
  "language": "en",
  "contracts": [
    {
      "id": "001637-2023-1",
      "value": {
        "amount": 350000,
        "currency": "GBP"
      },
      "status": "active",
      "awardID": "001637-2023-1",
      "dateSigned": "2023-01-19T00:00:00Z"
    }
  ],
  "initiationType": "tender"
}